Senior Process Engineer
Department: Engineering
Employment Type: Full Time
Location: Plymouth
Description
The Thin Film Ellipsometry Process Engineer is responsible for developing, optimising, and controlling thin‑film optical measurement and characterisation processes to support high‑yield, high‑performance semiconductor device fabrication. This role focuses on ellipsometry‑based metrology for deposited thin films across development and production environments.
Key Responsibilities
- Develop, qualify, and optimise ellipsometry measurement processes for thin films (thickness, refractive index n/k, composition, and uniformity).
- Support R&D and new materials development by providing accurate thin‑film characterisation, measurement development, and data analysis.
- Own and maintain ellipsometry process recipes, optical models, and control strategies.
- Provide accurate metrology feedback to thin‑film deposition processes (e.g., PVD, CVD, ALD).
- Analyse film properties including thickness mapping, optical constants, and process‑induced variation.
- Develop and refine optical models for multilayer thin‑film stacks.
- Utilise statistical process control (SPC) to monitor tool performance and process stability.
- Conduct root cause analysis for measurement drift, model instability, or yield excursions related to film properties.
- Collaborate with equipment and process engineering teams to maintain and improve metrology tool performance.
- Support new product introduction (NPI) through film characterisation, DOE planning, and process transfer.
- Generate technical reports and present findings to engineering and management teams.
- Ensure compliance with safety and cleanroom protocols.
Skills, Knowledge and Expertise
- Bachelor’s or Master’s degree in Materials Science, Physics, Electrical Engineering, or related field.
- 3–7+ years of experience in semiconductor or advanced thin‑film processing environments.
- Strong hands‑on experience with spectroscopic ellipsometry.
- Solid understanding of thin‑film optics, dispersion modelling, and multilayer analysis.
- Experience correlating ellipsometry data with complementary techniques (e.g., XRD, AFM, profilometry).
- Strong data analysis and problem‑solving skills.
- Strong ownership mentality with the ability to work independently in a fast‑paced environment.
- Adaptable and comfortable with evolving priorities and rapid change.
- Excellent cross‑functional collaboration skills (working effectively with process, equipment, R&D, and manufacturing teams).
- Clear and confident communicator, able to present technical findings to both technical and non‑technical audiences.
- Experience with compound semiconductor or dielectric thin films would be an advantage.
Perks & Benefits
- Pension scheme
- Private medical & dental insurance
- 28 days’ holiday + bank holidays
- Free onsite meals
- Onsite gym
- Relocation support
- Visa support available
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